31. Atomic Force Microscopy - Difraction and Microscopy Techniques

Today we’ll take a deep dive into Atomic Force Microscopy (AFM), a scanning probe microscopy technique that allows the visualization of surfaces at the nanometer level. AFM uses a sharp tip to scan the sample, detecting variations in the interaction force between the tip and the surface, which are then used to generate topographic and phase images. Don’t forget to follow and share the podcast so more people can take a deep dive into materials engineering. If you want a list of the episodes divided by course, check out this ⁠⁠link⁠⁠.