Eric Goodwin on Interferometry, Optics, and Metrology
from The Spotlight Report Hosted by The Spotlight Report
Eric Goodwin wrote the Field Guide to Interferometric Testing, and now is the Director of Optical Sciences at Nikon Research Corporation of America. In his work, he has undoubtedly worked on cutting edge optical systems and products, providing him a unique insight into delivering reliable solutions at the forefront of optical products. Eric discusses his deep background in optical metrology and testing, and additionally shares insights regarding managing complex optics projects and teams. Lastly, I had the pleasure of sharing stories with Eric regarding our own experiences working with Dr. Barrett and Dr. Greivenkamp. References: 1) Field Guide to Interferometric Optical Testing 2) Nikon Optics Research 2) Campbell, E W, Phillion, D W, and Sommargren, G E. Sub-nanometer interferometry for aspheric mirror fabrication. United States: N. p., 1999. Web. 3) An example of the use of point diffraction interferometry 4) Theory and Application of Point-Diffraction Interferometers
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