Lecture 10: Interface Damage & Negative Bias Temperature Instability
from [Audio] Nanostructured Electronic Devices: Percolation and Reliability Hosted by Muhammad A. Alam
Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions
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