SiC reliability testing for making chips that last

from Podcast4Engineers · host Infineon Technologies AG

How can we make sure our chips work reliably for decades without having decades to test them? In this episode, we dive deep into the topic of silicon carbide (SiC) reliability testing with our expert guest Paul Salmen. Be sure to check out the training Paul mentions to learn more about gate oxide reliability for CoolSiC™ devices.

Episode metadata supplied by the publisher feed · Published Dec 10, 2024

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SiC reliability testing for making chips that last

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