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EPISODE · Nov 14, 2008
ECE 612 Lecture 19: Device Variability
from [Audio] ECE 612: Nanoscale Transistors (Fall 2008) · host Mark Lundstrom
Outline:1) Sources of variability,2) Random dopantfluctuations (RDF),3) Line edge roughness (LER),4) Impact on design.
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ECE 612 Lecture 19: Device Variability
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