Stress Maps, Not Single Numbers

Got something to say to this podcast? Send a voicemail, and you might hear yourself on the next episode! Episode 113 of the Professor Alex Volinsky podcast. Every deposited SiC film carries residual stress, and Stoney's 1909 equation reads it as one number for the whole wafer — but real deposition is non-uniform, and the stress concentrations that crack films hide near the wafer edge. Nonparametric estimation lets the data decide the stress field's shape. Based on the paper: Nonparametric Estimation of SiC Film Residual Stress from the Wafer Surface Profile; O. Savchuk, A.A. Volinsky; Measurement, 2021, Vol. 177, 109238. Hosts Elena and Marcus. AI-generated voices.

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Stress Maps, Not Single Numbers

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Talking Biotech with Dr. Kevin Folta Kevin Folta Talking Biotech is a weekly podcast that uncovers the stories, ideas and research of people at the frontier of biology and engineering.Each episode explores how science and technology will transform agriculture, protect the environment, and feed 10 billion people by 2050.Interviews are led by Dr. Kevin Folta, a professor of molecular biology and genomics.

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This episode was published on October 11, 2026.

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